2M Strumenti - Logo

2M STRUMENTI

Always your partner

 

Seeing at the Nanoscale X - 09.07/11.07.2012
We are pleased to announce Seeing at the Nanoscale 2012, the tenth annual scientific conference focusing on nanostructure imaging, characterization, and modification using scanning probe microscopy (SPM) and related techniques.

First Edition of the Conference on Superconductivity and Functional Oxides
This conference is the merger of SATT (Conferenza Nazionale di Superconduttività) and FOxE (Congresso Nazionale sugli Ossidi Funzionali per l'Elettronica). SuperFOx will provide a common forum for scientists from the fields of superconductivity and
Conference site
Flyer SuperFOx

Workshop Buker AFM Fastscan - The world's fastest AFM! Roma and Napoli, COMING SOON!
Stato dell’arte delle tecnologie Bruker SPM - Dimension FastScan: scansione 100 volte più veloce, frame rate dell’ordine del secondo ScanAsyst HR: scansione del tutto autonoma
Dimension FastScan AFM The World's Fastest Atomic Force Microscope

Workshop Buker AFM Fastscan - The world's fastest AFM! Milano, november 22, 2011 and Pisa, november 23, 2011
Stato dell’arte delle tecnologie Bruker SPM - Dimension FastScan: scansione 100 volte più veloce, frame rate dell’ordine del secondo ScanAsyst HR: scansione del tutto autonoma
Dimension FastScan AFM The World's Fastest Atomic Force Microscope
Workshop Fastscan Brochure

WOCSDICE 2011 - 35th Workshop on Compound Semiconductor Devices and Integrated Circuits

Workshop site

GraphITA - A Multidisciplinary and Intersectorial Workshop on Synthesis, Characterization and Technological Exploitation of Graphene

Workshop site

Presentation of New Bruker AFMs - Torino - 20.04.11
Icon and Catalyst
External site
Announcement

New Bruker AFM platforms and modes - Genova - 19.04.11
Icon e Catalyst
Sito esterno
Locandina evento

Carbomat 2010 - 6-8 Ottobre 2010
Workshop on Carbon-based low dimensional materials
Workshop site

Veeco Users Meeting - 16.09.2010
Veeco Users Meeting
Sito esterno
Locandina

Workshop a Bologna - 16.03.2010
CARATTERIZZAZIONE NANOMECCANICA QUANTITATIVA DELLE SUPERFICI TRAMITE MICROSCOPIA A SONDA IN SCANSIONE
Sito esterno
Programma scientifico e Scheda di partecipazione

Workshop a Bari - 11.03.2010
CARATTERIZZAZIONE NANOMECCANICA QUANTITATIVA DELLE SUPERFICI TRAMITE MICROSCOPIA A SONDA IN SCANSIONE
Sito esterno
Programma scientifico e Scheda di partecipazione

European Biophysic Congress - Genoa - 11/15.07.2009
Patrocinio EBSA e SIBPA
Sito esterno
Scientific Program

Events and Meetings

All Events

Estimates Online - Material Consumption

Password Request
Versione Italiana
Main Office: Via G.Pontano,9 - 00141 Roma - Phone: +39.0686895319 - Fax: +39.06.86895241 / +39.06.90280447 - E-mail: info@2mstrumenti.com - P.IVA 01441681002 - C.C.I.A.A. di Roma n°05755810586 - Cap. soc. €101.490,00 Uff. Tecnico/Commerciale Lombardia: Tel.0143/63.38.07 - Fax 0143/34.62.28 - e-mail: pfrancella@2mstrumenti.com